TY - GEN
T1 - Effect of LaNiO3 electrode on crystallization of BaTiO 3 thin films for capacitors prepared by solgel technique
AU - Li, Bin
AU - Wang, Chunqing
AU - Wu, Weiwei
AU - Zhang, Wei
AU - Zhong, Ying
PY - 2011
Y1 - 2011
N2 - The conductive LaNi03 (LNO) and ferroelectric BaTi03 (BTO) thin films had been prepared by sol-gel method. The preparation process of LNO films had been optimized by studying on the effects of annealing temperature and film thickness on their properties and structures. The optimal annealing temperature of LNO films was 700 °C. With the increment of film thickness, the surface resistivity of LNO films reduced. It was found that the LNO films, could induce the crystal orientations of BTO thin films, would greatly expand the application of ferroelectric films in the field of capacitors.
AB - The conductive LaNi03 (LNO) and ferroelectric BaTi03 (BTO) thin films had been prepared by sol-gel method. The preparation process of LNO films had been optimized by studying on the effects of annealing temperature and film thickness on their properties and structures. The optimal annealing temperature of LNO films was 700 °C. With the increment of film thickness, the surface resistivity of LNO films reduced. It was found that the LNO films, could induce the crystal orientations of BTO thin films, would greatly expand the application of ferroelectric films in the field of capacitors.
UR - https://www.scopus.com/pages/publications/81355135887
U2 - 10.1109/ICEPT.2011.6066852
DO - 10.1109/ICEPT.2011.6066852
M3 - 会议稿件
AN - SCOPUS:81355135887
SN - 9781457717680
T3 - ICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging
SP - 357
EP - 360
BT - ICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging
T2 - 2011 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011
Y2 - 8 August 2011 through 11 August 2011
ER -