Skip to main navigation Skip to search Skip to main content

Effect of holding time on the self-joining of silicon nitride

  • C.F.Liu*
  • , J. Zhang
  • , Y. Zhou
  • , H. L. Yi
  • , M. Naka
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • The University of Osaka

Research output: Contribution to journalArticlepeer-review

Abstract

Reliable Si3N4/Si3N4 joints were obtained using Cu{single bond}Pd{single bond}Ti as filler alloy. The effect of holding time on interfacial microstructure and bonding strength of the joints was investigated. All the joints consist of continuous reaction layer (fine-grain TiN), discontinuous reaction layer (coarse-grain TiN), Cu-based solid solution and reaction products. Prolonged exposure to the elevated temperature causes the thickness of the discontinuous reaction layer to increase, due to the coarsening of TiN grains. And the amount of Pd{single bond}Si phase increases instead of Ti{single bond}Si phase. With the increase of holding time, the bonding strength of the joints decreases. The formation of a reaction layer with a suitable thickness promotes the improvement of bonding strength of joints.

Original languageEnglish
Pages (from-to)217-221
Number of pages5
JournalJournal of Alloys and Compounds
Volume471
Issue number1-2
DOIs
StatePublished - 5 Mar 2009
Externally publishedYes

Keywords

  • Bonding strength
  • Brazing
  • Cu{single bond}Pd{single bond}Ti filler alloy
  • Microstructure
  • SiN ceramics

Fingerprint

Dive into the research topics of 'Effect of holding time on the self-joining of silicon nitride'. Together they form a unique fingerprint.

Cite this