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Effect of He/Ne/Ar on EUV emission and Xe plasma pumped by capillary discharge

  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The influence of the He, Ne and Ar on Xe plasma pumped by capillary discharge process is studied theoretically and experimentally. The charge-state populations and average ionization of Xe as a function of electron temperature for pure Xe and mixed gases are calculated with a collision-radiation model. The emission of Xe10+ 4d8-4d75p 13.5 nm in 2% bandwidth is obtained by a EUV emission monitor (E-Mon). Additional He/Ne/Ar gas can influence on the time scale and the intensity of the appearance for the E-Mon signals by effecting the electron density and temperature.

Original languageEnglish
Article number125
JournalEuropean Physical Journal D
Volume67
Issue number6
DOIs
StatePublished - Jun 2013

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