Effect of grain size on the fatigue properties of Pb(Zr0.3Ti0.7)O3 thin films prepared by metalorganic decomposition

F. Yan; P. Bao; H. L.W. Chan; C. L. Choy; X. Chen; J. Zhu; Y. Wang

doi:10.1080/00150190108016258

Effect of grain size on the fatigue properties of Pb(Zr_0.3Ti_0.7)O₃ thin films prepared by metalorganic decomposition

F. Yan^*
, P. Bao
, H. L.W. Chan
, C. L. Choy
, X. Chen
, J. Zhu
, Y. Wang

^*Corresponding author for this work

Nanjing University

Research output: Contribution to journal › Conference article › peer-review

Abstract

The fatigue properties of PZT thin films with Pt electrodes are strongly influenced by the grain size. A film with smaller grains has better fatigue properties. We assume that the fatigue is mainly due to the pinning of domain walls in PZT grains by space charges or charged point defects near the Pt electrodes. The point defects always accumulate near the PZT/Pt interface because the internal electric field is very strong near the interface. Therefore the film with a lower fraction of grains touching the Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with decreasing grain size. This may arise from a decrease in the mobility of the domain walls.

Original language	English
Pages (from-to)	209-216
Number of pages	8
Journal	Ferroelectrics
Volume	252
Issue number	1-4
DOIs	https://doi.org/10.1080/00150190108016258
State	Published - 2001
Externally published	Yes
Event	6th International Simposium on Ferroic Domains and Mesoscopic Structures (ISFD-6) - Nanjing, China Duration: 29 May 2000 → 2 Jun 2000

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10.1080/00150190108016258

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title = "Effect of grain size on the fatigue properties of Pb(Zr0.3Ti0.7)O3 thin films prepared by metalorganic decomposition",

abstract = "The fatigue properties of PZT thin films with Pt electrodes are strongly influenced by the grain size. A film with smaller grains has better fatigue properties. We assume that the fatigue is mainly due to the pinning of domain walls in PZT grains by space charges or charged point defects near the Pt electrodes. The point defects always accumulate near the PZT/Pt interface because the internal electric field is very strong near the interface. Therefore the film with a lower fraction of grains touching the Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with decreasing grain size. This may arise from a decrease in the mobility of the domain walls.",

author = "F. Yan and P. Bao and Chan, \{H. L.W.\} and Choy, \{C. L.\} and X. Chen and J. Zhu and Y. Wang",

year = "2001",

doi = "10.1080/00150190108016258",

language = "英语",

volume = "252",

pages = "209--216",

journal = "Ferroelectrics",

issn = "0015-0193",

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note = "6th International Simposium on Ferroic Domains and Mesoscopic Structures (ISFD-6) ; Conference date: 29-05-2000 Through 02-06-2000",

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TY - JOUR

T1 - Effect of grain size on the fatigue properties of Pb(Zr0.3Ti0.7)O3 thin films prepared by metalorganic decomposition

AU - Yan, F.

AU - Bao, P.

AU - Chan, H. L.W.

AU - Choy, C. L.

AU - Chen, X.

AU - Zhu, J.

AU - Wang, Y.

PY - 2001

Y1 - 2001

N2 - The fatigue properties of PZT thin films with Pt electrodes are strongly influenced by the grain size. A film with smaller grains has better fatigue properties. We assume that the fatigue is mainly due to the pinning of domain walls in PZT grains by space charges or charged point defects near the Pt electrodes. The point defects always accumulate near the PZT/Pt interface because the internal electric field is very strong near the interface. Therefore the film with a lower fraction of grains touching the Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with decreasing grain size. This may arise from a decrease in the mobility of the domain walls.

AB - The fatigue properties of PZT thin films with Pt electrodes are strongly influenced by the grain size. A film with smaller grains has better fatigue properties. We assume that the fatigue is mainly due to the pinning of domain walls in PZT grains by space charges or charged point defects near the Pt electrodes. The point defects always accumulate near the PZT/Pt interface because the internal electric field is very strong near the interface. Therefore the film with a lower fraction of grains touching the Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with decreasing grain size. This may arise from a decrease in the mobility of the domain walls.

UR - https://www.scopus.com/pages/publications/0034872532

U2 - 10.1080/00150190108016258

DO - 10.1080/00150190108016258

M3 - 会议文章

AN - SCOPUS:0034872532

SN - 0015-0193

VL - 252

SP - 209

EP - 216

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1-4

T2 - 6th International Simposium on Ferroic Domains and Mesoscopic Structures (ISFD-6)

Y2 - 29 May 2000 through 2 June 2000

ER -

Effect of grain size on the fatigue properties of Pb(Zr_0.3Ti_0.7)O₃ thin films prepared by metalorganic decomposition

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