Effect of electric-field-assisted thermal treatment on the strain and ferroelectric properties of (100)-oriented ferroelectric Pb(Zr0.52Ti0.48)O3 thin films

Siqi Zhang; Shengkai Wang; Fu Zheng; Chenfei Jin

doi:10.1016/j.jpcs.2016.08.020

Effect of electric-field-assisted thermal treatment on the strain and ferroelectric properties of (100)-oriented ferroelectric Pb(Zr_0.52Ti_0.48)O₃ thin films

Siqi Zhang^*
, Shengkai Wang
, Fu Zheng
, Chenfei Jin

^*Corresponding author for this work

School of Physics

Harbin Institute of Technology
Key Laboratory of Micro-Optics and Photonic Technology of Heilongjiang Province
CAS - Institute of Microelectronics
Key Laboratory of Microelectronics Devices & Integrated Technology

Research output: Contribution to journal › Article › peer-review

Abstract

Ferroelectric Pb(Zr_0.52Ti_0.48)O₃ thin films were deposited on the Pt/Ti/SiO₂/Si substrate by a sol-gel method. As a direct electric field was applied on the films during thermal treatment, strain behavior and ferroelectric properties have been investigated. X-ray diffraction patterns show that great tensile strain exists nearby the interface of the 250 nm thin film while thermal treatment assisted with direct electric field can obviously relax it. The analysis of hysteresis loops indicates that the remnant polarization increases with the thermal treatment time. These results suggest that electric-field-assisted thermal treatment is an effective way to reduce films' tensile strain through the local plastic deformation in Pt layer and enhance the remnant polarization.

Original language	English
Pages (from-to)	148-152
Number of pages	5
Journal	Journal of Physics and Chemistry of Solids
Volume	99
DOIs	https://doi.org/10.1016/j.jpcs.2016.08.020
State	Published - 1 Dec 2016

Keywords

A Nanostructures
B Sol-gel growth
C X-ray diffraction
D Surface properties

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10.1016/j.jpcs.2016.08.020

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title = "Effect of electric-field-assisted thermal treatment on the strain and ferroelectric properties of (100)-oriented ferroelectric Pb(Zr0.52Ti0.48)O3 thin films",

abstract = "Ferroelectric Pb(Zr0.52Ti0.48)O3 thin films were deposited on the Pt/Ti/SiO2/Si substrate by a sol-gel method. As a direct electric field was applied on the films during thermal treatment, strain behavior and ferroelectric properties have been investigated. X-ray diffraction patterns show that great tensile strain exists nearby the interface of the 250 nm thin film while thermal treatment assisted with direct electric field can obviously relax it. The analysis of hysteresis loops indicates that the remnant polarization increases with the thermal treatment time. These results suggest that electric-field-assisted thermal treatment is an effective way to reduce films' tensile strain through the local plastic deformation in Pt layer and enhance the remnant polarization.",

keywords = "A Nanostructures, B Sol-gel growth, C X-ray diffraction, D Surface properties",

author = "Siqi Zhang and Shengkai Wang and Fu Zheng and Chenfei Jin",

note = "Publisher Copyright: {\textcopyright} 2016 Elsevier Ltd",

year = "2016",

month = dec,

day = "1",

doi = "10.1016/j.jpcs.2016.08.020",

language = "英语",

volume = "99",

pages = "148--152",

journal = "Journal of Physics and Chemistry of Solids",

issn = "0022-3697",

publisher = "Elsevier Ltd",

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TY - JOUR

T1 - Effect of electric-field-assisted thermal treatment on the strain and ferroelectric properties of (100)-oriented ferroelectric Pb(Zr0.52Ti0.48)O3 thin films

AU - Zhang, Siqi

AU - Wang, Shengkai

AU - Zheng, Fu

AU - Jin, Chenfei

PY - 2016/12/1

Y1 - 2016/12/1

N2 - Ferroelectric Pb(Zr0.52Ti0.48)O3 thin films were deposited on the Pt/Ti/SiO2/Si substrate by a sol-gel method. As a direct electric field was applied on the films during thermal treatment, strain behavior and ferroelectric properties have been investigated. X-ray diffraction patterns show that great tensile strain exists nearby the interface of the 250 nm thin film while thermal treatment assisted with direct electric field can obviously relax it. The analysis of hysteresis loops indicates that the remnant polarization increases with the thermal treatment time. These results suggest that electric-field-assisted thermal treatment is an effective way to reduce films' tensile strain through the local plastic deformation in Pt layer and enhance the remnant polarization.

AB - Ferroelectric Pb(Zr0.52Ti0.48)O3 thin films were deposited on the Pt/Ti/SiO2/Si substrate by a sol-gel method. As a direct electric field was applied on the films during thermal treatment, strain behavior and ferroelectric properties have been investigated. X-ray diffraction patterns show that great tensile strain exists nearby the interface of the 250 nm thin film while thermal treatment assisted with direct electric field can obviously relax it. The analysis of hysteresis loops indicates that the remnant polarization increases with the thermal treatment time. These results suggest that electric-field-assisted thermal treatment is an effective way to reduce films' tensile strain through the local plastic deformation in Pt layer and enhance the remnant polarization.

KW - A Nanostructures

KW - B Sol-gel growth

KW - C X-ray diffraction

KW - D Surface properties

UR - https://www.scopus.com/pages/publications/84986327460

U2 - 10.1016/j.jpcs.2016.08.020

DO - 10.1016/j.jpcs.2016.08.020

M3 - 文章

AN - SCOPUS:84986327460

SN - 0022-3697

VL - 99

SP - 148

EP - 152

JO - Journal of Physics and Chemistry of Solids

JF - Journal of Physics and Chemistry of Solids

ER -

Effect of electric-field-assisted thermal treatment on the strain and ferroelectric properties of (100)-oriented ferroelectric Pb(Zr_0.52Ti_0.48)O₃ thin films

Abstract

Keywords

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