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Effect of defected behavior on interfacial heat transferring performance for HP-LED packaging based on entropy generation analysis

  • Guilin University of Electronic Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Entropy generation is a kind of available energy loss. It is an important topic in the field of heat conduction and energy design. There are many interfaces inside the chip of high power LED (HP-LED), and these interfaces are easily affected by wet-heat stress and cause interface defects, such as interface cracking. The effect of defected behavior on interfacial heat transferring performance for HP-LED packaging based on entropy generation theory is proposed. First, the influence of different cracks length on the entropy generation at the topinterface is studied. Second, the temperature distribution of DA with different cracking lengths is showed. Finally, the delamination on top and bottom-interface are compared. The results show that, under the same situations, the entropy generation value of bottom-interface is larger than that of the top-interface, which implies that the influence of the heat transfer ability in bottom-interface of the DA layer is more serious.

Original languageEnglish
Title of host publicationProceedings - 2018 19th International Conference on Electronic Packaging Technology, ICEPT 2018
EditorsFei Xiao, Jun Wang, Lin Chen, Tianchun Ye
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages423-427
Number of pages5
ISBN (Electronic)9781538663868
DOIs
StatePublished - 2 Oct 2018
Externally publishedYes
Event19th International Conference on Electronic Packaging Technology, ICEPT 2018 - Shanghai, China
Duration: 8 Aug 201811 Aug 2018

Publication series

NameProceedings - 2018 19th International Conference on Electronic Packaging Technology, ICEPT 2018

Conference

Conference19th International Conference on Electronic Packaging Technology, ICEPT 2018
Country/TerritoryChina
CityShanghai
Period8/08/1811/08/18

Keywords

  • DA layer
  • Thermal effect
  • cracking
  • entropy generation

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