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EBEM: An Enhanced Bi-encoder Model for Word Sense Disambiguation

  • Xianglong Xiao*
  • , Hongguang Xu
  • , Ke Xu
  • *Corresponding author for this work
  • Harbin Institute of Technology Shenzhen
  • Peng Cheng Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Word Sense Disambiguation (WSD) systems have recently achieved unprecedented high performance and have approached or even exceeded the human level. However, almost all these systems only focus on integrating knowledge and designing the WSD classification layer while having few works related to loss function, which is equally essential for WSD systems. In this paper, we propose Enhanced Bi-encoder Model (EBEM) with a more flexible loss function, Circle loss, and enhanced representations via knowledge from documents and WordNet. EBEM is strong in fine-grained sense discrimination. Our experimental results show that EBEM produces a considerable performance improvement compared with Bi-encoder Model (BEM) and achieves state-of-the-art results on English all-words WSD. More importantly, EBEM has an excellent performance in few-shot learning, which will contribute to the further application and extension of WSD. We also verify the effectiveness of Circle loss in WSD systems and report how it affects the clusters of sense representations.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE International Conference on Big Data, Big Data 2022
EditorsShusaku Tsumoto, Yukio Ohsawa, Lei Chen, Dirk Van den Poel, Xiaohua Hu, Yoichi Motomura, Takuya Takagi, Lingfei Wu, Ying Xie, Akihiro Abe, Vijay Raghavan
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3642-3650
Number of pages9
ISBN (Electronic)9781665480451
DOIs
StatePublished - 2022
Externally publishedYes
Event2022 IEEE International Conference on Big Data, Big Data 2022 - Osaka, Japan
Duration: 17 Dec 202220 Dec 2022

Publication series

NameProceedings - 2022 IEEE International Conference on Big Data, Big Data 2022

Conference

Conference2022 IEEE International Conference on Big Data, Big Data 2022
Country/TerritoryJapan
CityOsaka
Period17/12/2220/12/22

Keywords

  • Circle loss
  • bi-encoder
  • enhanced representations
  • few-shot learning
  • word sense disambiguation

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