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Dynamic mixing deposition of niobium nitride films by cathodic arc plasma in ambient nitrogen

  • T. Zhang
  • , J. H. Song
  • , X. B. Tian
  • , P. K. Chu*
  • , I. G. Brown
  • *Corresponding author for this work
  • Beijing Normal University
  • City University of Hong Kong
  • University of California at Berkeley

Research output: Contribution to journalArticlepeer-review

Abstract

The synthesis and properties of niobium nitride films using niobium cathodic arc plasma reactive deposition in a nitrogen atmosphere with and without energetic ion dynamic mixing was discussed. The nitrogen content was higher in the films deposited using energetic ion dynamic mixing at a maximum substrate temperature of 180°centigrate. The films deposited without energetic ion dynamic mixing was found to be smooth and continuous while those with energetic ion dynamic mixing exhibit delamination due to poor adhesion. The results showed that with energetic ion dynamic mixing, niobium nitride films could be fabricated at low substrate temperature using a niobium metal arc plasma source in a nitrogen immersion configuration.

Original languageEnglish
Pages (from-to)2048-2050
Number of pages3
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume19
Issue number5
DOIs
StatePublished - Sep 2001
Externally publishedYes

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