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Dynamic measurement of normal spectral emissivity (at 905nm) by a pulse-heating reflectometric technique

  • Peng Xiao*
  • , Jingmin Dai
  • , Zijun Wang
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Pulse-heating experiments were performed on the strip specimen, taking the specimen from room temperature to melting point based on rapid resistive self-heating of the specimen. The normal spectral emissivity of the specimen was measured by integrating sphere reflectometry developed at HIT. At the same time, the radiance temperature is measured by high-speed pyrometer from 1100K to melting point. Details of the measurement technique, measurement apparatus and the calibration technique are described. Results of normal spectral emissivity of niobium at 905nm from room temperature to its melting point are presented and discussed.

Original languageEnglish
Title of host publication3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subtitle of host publicationOptical Test and Measurement Technology and Equipment
DOIs
StatePublished - 2007
Event3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China
Duration: 8 Jul 200712 Jul 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6723
ISSN (Print)0277-786X

Conference

Conference3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Country/TerritoryChina
CityChengdu
Period8/07/0712/07/07

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