Skip to main navigation Skip to search Skip to main content

Dual-ellipse fitting approach for robust gait periodicity detection

  • Xianye Ben*
  • , Weixiao Meng
  • , Rui Yan
  • *Corresponding author for this work
  • Shandong University
  • School of Electronics and Information Engineering, Harbin Institute of Technology
  • Rensselaer Polytechnic Institute

Research output: Contribution to journalArticlepeer-review

Abstract

A new gait period detection algorithm, dual-ellipse fitting (DEF) approach, is proposed. DEF is that two regions of the whole silhouette divided by the centroid are fitted into two ellipses, respectively. We construct the gait fluctuation as a periodic function which depends on the eccentricities of two halves of the silhouette over time. Experimental results show that the proposed method is robust to scale, translation, direction of walking and carrying a bag.

Original languageEnglish
Pages (from-to)173-178
Number of pages6
JournalNeurocomputing
Volume79
DOIs
StatePublished - 1 Mar 2012
Externally publishedYes

Keywords

  • Dual-ellipse fitting
  • Eccentricity
  • Gait period detection
  • Gait recognition

Fingerprint

Dive into the research topics of 'Dual-ellipse fitting approach for robust gait periodicity detection'. Together they form a unique fingerprint.

Cite this