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DSTN sleep transistor sizing with a new approach to estimate the maximum instantaneous current

  • Yu Sun*
  • , Li Yi Xiao
  • , Cong Shi
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Power gating is one of most effective ways to suppress the leakage power in CMOS digital circuits. In this paper, we propose a new method to estimate the maximum instantaneous current (MIC), and derive an analytical model for the MIC of the clusters in distributed sleep transistor network (DSTN) power-gated circuits. Based on this MIC estimation model, we perform ST sizing in DSTN power-gated circuits. Experimental results show that we have achieved higher precision and less runtime.

Original languageEnglish
Title of host publicationISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems
Subtitle of host publicationNano-Bio Circuit Fabrics and Systems
PublisherIEEE Computer Society
Pages3717-3720
Number of pages4
ISBN (Print)9781424453085
DOIs
StatePublished - 2010
Event2010 IEEE International Symposium on Circuits and Systems, ISCAS 2010 - Paris, France
Duration: 30 May 20102 Jun 2010

Publication series

NameISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems

Conference

Conference2010 IEEE International Symposium on Circuits and Systems, ISCAS 2010
Country/TerritoryFrance
CityParis
Period30/05/102/06/10

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