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Dominant role of oxygen vacancies in electrical properties of unannealed LaAlO3/SrTiO3 interfaces

  • Z. Q. Liu*
  • , L. Sun
  • , Z. Huang
  • , C. J. Li
  • , S. W. Zeng
  • , K. Han
  • , W. M. Lü
  • , T. Venkatesan
  • , Ariando
  • *Corresponding author for this work
  • National University of Singapore
  • Oak Ridge National Laboratory

Research output: Contribution to journalArticlepeer-review

Abstract

We report that in unannealed LaAlO3/SrTiO3 (LAO/STO) heterostructures the critical thickness for the appearance of the two-dimensional electron gas can be less than 4 unit cell, the interface is conducting even for STO substrates with mixed terminations and the low-temperature resistance upturn in LAO/STO heterostructures with thick LAO layers strongly depends on laser fluence. Our experimental results provide fundamental insights into the different roles played by oxygen vacancies and polarization catastrophe in the two-dimensional electron gas in crystalline LAO/STO heterostructures.

Original languageEnglish
Article number054303
JournalJournal of Applied Physics
Volume115
Issue number5
DOIs
StatePublished - 7 Feb 2014
Externally publishedYes

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