TY - GEN
T1 - Distributed sampling of multiple sinusoids with finite rate of innovation
AU - Wei, Zhiliang
AU - Fu, Ning
AU - Qiao, Liyan
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/5
Y1 - 2019/5
N2 - In this paper, we propose a new distributed sampling scheme for multiple sinusoids signals, which can further reduce the number of samples for each sampling channel. Based on the frequency sparse common support (SCS) model, we recover the signals using samples from several channels jointly. We propose a distributed time-staggered sampling (DTSS) system, which requires only \lceil K+K / P\rceil samples per non-delay channel and K samples for the delay channel when recovering K frequency components by P channels. In addition, the staggered time is required no longer than the Nyquist sampling interval in the method. Simulation results verify that the proposed methods can successfully recover the multiple sinusoids signals at a lower sampling rate.
AB - In this paper, we propose a new distributed sampling scheme for multiple sinusoids signals, which can further reduce the number of samples for each sampling channel. Based on the frequency sparse common support (SCS) model, we recover the signals using samples from several channels jointly. We propose a distributed time-staggered sampling (DTSS) system, which requires only \lceil K+K / P\rceil samples per non-delay channel and K samples for the delay channel when recovering K frequency components by P channels. In addition, the staggered time is required no longer than the Nyquist sampling interval in the method. Simulation results verify that the proposed methods can successfully recover the multiple sinusoids signals at a lower sampling rate.
KW - Distributed sampling
KW - Frequency sparse common support
KW - Multiple sinusoids
KW - Sub-Nyquist
UR - https://www.scopus.com/pages/publications/85072837666
U2 - 10.1109/I2MTC.2019.8826855
DO - 10.1109/I2MTC.2019.8826855
M3 - 会议稿件
AN - SCOPUS:85072837666
T3 - I2MTC 2019 - 2019 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
BT - I2MTC 2019 - 2019 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
T2 - 2019 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019
Y2 - 20 May 2019 through 23 May 2019
ER -