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Diode Open-Circuit Fault Research on the Parallel-Connected 36-Pulse Rectifier With Dual Passive Harmonic Reduction Method

  • Qingxiao Du
  • , Lei Gao
  • , Quanhui Li
  • , Xinyu Yin
  • , Fangang Meng*
  • *Corresponding author for this work
  • School of Electrical Engineering and Automation, Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

To clarify the influence of using different harmonic reduction circuits (HRCs) on open-circuit fault characteristics, and the relationship between steady-state and fault-state power quality of the multi-pulse rectifiers (MPRs), this article focuses on the diode open-circuit fault research of the parallel-connected 36-pulse rectifier with dc-side dual passive HRC. Based on the normal operation modes of the MPR, the fault characteristics under diode open-circuit fault in the main circuit and the HRC are discussed in detail. Besides, the power quality comparisons between the MPRs with single or dual passive HRC are presented under fault conditions. From the simulation and experiment verification results, the load voltage can exactly reflect the location of the fault diode, and fault diode located in the dc-side HRC causes less damage on the power quality of the MPR. In general, compared with single passive HRC, dual passive HRC can reduce the impact of diode open-circuit fault on ac-side power quality. Adding dual passive HRC is a reliable method to improve the power quality of MPRs.

Original languageEnglish
Pages (from-to)6821-6830
Number of pages10
JournalIEEE Transactions on Power Electronics
Volume37
Issue number6
DOIs
StatePublished - 1 Jun 2022
Externally publishedYes

Keywords

  • 36-pulse rectifier
  • dc-side dual-passive harmonic reduction method
  • diode open-circuit fault research

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