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Dielectric tunability of Ba xSr 1-xTiO 3 thin films grown on a compliant substrate

  • Hua Ping Wu*
  • , Bin Xu
  • , Xiao Yan Lu
  • *Corresponding author for this work
  • Zhejiang University of Technology
  • School of Civil Engineering, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The phase transition temperature and dielectric tunability of Ba xSr 1-xTiO 3 (BST) thin films grown on a compliant substrate are theoretically investigated using the Ginzburg-Landau-Devonshire theory combined with the Timosheko elastic theory by considering thin films' and substrates' thickness-dependent relaxation of lattice-mismatch strain. Our results indicate that the dielectric characteristics of BST thin films deposited on compliant substrates are different from those of their bulk counterparts. The ferroelectricity and dielectric performances of the BST thin films can be modulated by changing the thickness ratio of the film to substrate or the stress state. This is an effectively theoretical guidance for the property optimization of ferroelectric thin films used in microwave devices.

Original languageEnglish
Title of host publicationProceedings of the 2011 Symposium on Piezoelectricity, Acoustic Waves and Device Applications, SPAWDA 2011
Pages449-452
Number of pages4
DOIs
StatePublished - 2011
Externally publishedYes
Event2011 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications, SPAWDA 2011 - Shenzhen, Guangdong, China
Duration: 9 Dec 201111 Dec 2011

Publication series

NameProceedings of the 2011 Symposium on Piezoelectricity, Acoustic Waves and Device Applications, SPAWDA 2011

Conference

Conference2011 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications, SPAWDA 2011
Country/TerritoryChina
CityShenzhen, Guangdong
Period9/12/1111/12/11

Keywords

  • Compliant substrate
  • Dielectric tenability
  • Ferroelectric thin film
  • Stress control

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