Dielectric Properties of DMSO-Doped-PEDOT:PSS at THz Frequencies

Poly(3,4-ethylenedioxythiophene):poly(4-styrenesulfonate) (PEDOT:PSS) is a promising candidate for terahertz (THz) metamaterial devices. Its dielectric properties can be changed by the dopant dimethylsulfoxide (DMSO). In this study, the dielectric properties of DMSO-doped-PEDOT:PSS films are investigated using terahertz time-domain spectroscopy (THz-TDS) measurements. The values of the carrier density and mobility are also determined by fitting the dielectric permittivity to the Drude–Smith model. A simple THz frequency selective surface (FSS) is designed based on these DMSO-doped-PEDOT:SS films. Strong band rejection can be achieved at resonant frequencies. These results may inspire the development of new materials for manipulating THz waves in future studies.