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Development of automated inspection system for highway surface distress

  • Xiangshen Hou*
  • , Hua Wang
  • , Qi Wang
  • , Zheren Wang
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An automated system is developed and described for the inspection of the surface distress of highway pavements in this paper. The system comprises of four modules: artificial illumination module, image acquisition module, sync control module, data storage and analysis module. The system is capable of collecting and analyzing highway cracks with high-resolution digital images. The system can carry out crack surveys at a nominal speed of 72km/h with full coverage of pavement surface. Crack recognition is performed offline. The prototype has been tested in laboratory conditions and completed a survey of about 15,000km real road at normal running speed (72km/h).

Original languageEnglish
Title of host publicationFundamental Problems of Optoelectronics and Microelectronics III
DOIs
StatePublished - 2007
EventFundamental Problems of Optoelectronics and Microelectronics III - Harbin, China
Duration: 12 Sep 200614 Sep 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6595 I
ISSN (Print)0277-786X

Conference

ConferenceFundamental Problems of Optoelectronics and Microelectronics III
Country/TerritoryChina
CityHarbin
Period12/09/0614/09/06

Keywords

  • Image processing
  • Pavement surface distress
  • Survey system

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