Skip to main navigation Skip to search Skip to main content

Development of a High-precision Broadband Current Probe for Non-invasive Impedance Measurements

  • Zhuowei Han
  • , Zhitian Wang
  • , Zhongliang Du
  • , Ming Li
  • , Gang Zhang*
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • China Aero-Polytechnology Establishment

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Abstract - Non-intrusive measurement methods allow for the timely detection of system impedance changes through in-situ detection without disassembling the components of the system under test. This enables the isolation of potential faulty components and facilitates condition-based maintenance. By constructing an equivalent circuit model of the current probe and analyzing its frequency response curve based on the formula, the impact of distributed parameters on the current probe is studied. Electromagnetic simulation software is employed to build an electromagnetic model of the current probe, optimizing parameters such as the number of coil turns, core material, and core characteristics. Finally, a small-size broadband current probe and a corresponding calibration fixture are designed. Experimental results demonstrate that the current probe meets the design requirements and is suitable for broadband impedance measurements.

Original languageEnglish
Title of host publicationProceedings of 2024 International Symposium on Integrated Circuit Design and Integrated Systems, ICDIS 2024
PublisherAssociation for Computing Machinery, Inc
Pages71-78
Number of pages8
ISBN (Electronic)9798400718229
DOIs
StatePublished - 27 Jan 2025
Event2024 International Symposium on Integrated Circuit Design and Integrated Systems, ICDIS 2024 - Hybrid, Xiamen, China
Duration: 22 Nov 202424 Nov 2024

Publication series

NameProceedings of 2024 International Symposium on Integrated Circuit Design and Integrated Systems, ICDIS 2024

Conference

Conference2024 International Symposium on Integrated Circuit Design and Integrated Systems, ICDIS 2024
Country/TerritoryChina
CityHybrid, Xiamen
Period22/11/2424/11/24

Keywords

  • Contact impedance
  • Current probe
  • Electrical connector
  • Non-intrusive measurement

Fingerprint

Dive into the research topics of 'Development of a High-precision Broadband Current Probe for Non-invasive Impedance Measurements'. Together they form a unique fingerprint.

Cite this