Determination of the accumulated location of microparticle collection caused by AC EO

Hukun Yang; Hongyuan Jiang; Hui Yan; Changbo Ma

doi:10.1109/ICIEA.2007.4318409

Determination of the accumulated location of microparticle collection caused by AC EO

Hukun Yang^*
, Hongyuan Jiang
, Hui Yan
, Changbo Ma

^*Corresponding author for this work

School of Mechatronics Engineering, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

AC-electroosmosis (AC EO) shows many advantages in collecting microparticles, such as low signal voltage, little sample, real-time detection and integrating in microchip easily. An experiment showed that the microparticles in sample would be accumulated on a fixed field on the surface of the microelectrodes caused by the AC electric field. Based on the phenomena, the velocity field of AC EO in microchannel is explored and the process of microparticles accumulated is explained. The location of microparticles accumulated is determined based on the numerical simulation results, at the same time, the rate relation between the accumulated location and the width ofmicroelectrode, which offers the theoretic base for further analyzing and detecting microparticles.

Original language	English
Title of host publication	ICIEA 2007
Subtitle of host publication	2007 Second IEEE Conference on Industrial Electronics and Applications
Pages	251-254
Number of pages	4
DOIs	https://doi.org/10.1109/ICIEA.2007.4318409
State	Published - 2007
Externally published	Yes
Event	2007 2nd IEEE Conference on Industrial Electronics and Applications, ICIEA 2007 - Harbin, China Duration: 23 May 2007 → 25 May 2007

Publication series

Name	ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications

Conference

Conference	2007 2nd IEEE Conference on Industrial Electronics and Applications, ICIEA 2007
Country/Territory	China
City	Harbin
Period	23/05/07 → 25/05/07

Access to Document

10.1109/ICIEA.2007.4318409

Cite this

Yang, H., Jiang, H., Yan, H., & Ma, C. (2007). Determination of the accumulated location of microparticle collection caused by AC EO. In ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications (pp. 251-254). Article 4318409 (ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications). https://doi.org/10.1109/ICIEA.2007.4318409

@inproceedings{96b085d72da24cf7b8e6854a985dd70d,

title = "Determination of the accumulated location of microparticle collection caused by AC EO",

abstract = "AC-electroosmosis (AC EO) shows many advantages in collecting microparticles, such as low signal voltage, little sample, real-time detection and integrating in microchip easily. An experiment showed that the microparticles in sample would be accumulated on a fixed field on the surface of the microelectrodes caused by the AC electric field. Based on the phenomena, the velocity field of AC EO in microchannel is explored and the process of microparticles accumulated is explained. The location of microparticles accumulated is determined based on the numerical simulation results, at the same time, the rate relation between the accumulated location and the width ofmicroelectrode, which offers the theoretic base for further analyzing and detecting microparticles.",

author = "Hukun Yang and Hongyuan Jiang and Hui Yan and Changbo Ma",

year = "2007",

doi = "10.1109/ICIEA.2007.4318409",

language = "英语",

isbn = "1424407370",

series = "ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications",

pages = "251--254",

booktitle = "ICIEA 2007",

note = "2007 2nd IEEE Conference on Industrial Electronics and Applications, ICIEA 2007 ; Conference date: 23-05-2007 Through 25-05-2007",

}

Yang, H, Jiang, H, Yan, H & Ma, C 2007, Determination of the accumulated location of microparticle collection caused by AC EO. in ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications., 4318409, ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications, pp. 251-254, 2007 2nd IEEE Conference on Industrial Electronics and Applications, ICIEA 2007, Harbin, China, 23/05/07. https://doi.org/10.1109/ICIEA.2007.4318409

Determination of the accumulated location of microparticle collection caused by AC EO. / Yang, Hukun; Jiang, Hongyuan; Yan, Hui et al.
ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications. 2007. p. 251-254 4318409 (ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Determination of the accumulated location of microparticle collection caused by AC EO

AU - Yang, Hukun

AU - Jiang, Hongyuan

AU - Yan, Hui

AU - Ma, Changbo

PY - 2007

Y1 - 2007

N2 - AC-electroosmosis (AC EO) shows many advantages in collecting microparticles, such as low signal voltage, little sample, real-time detection and integrating in microchip easily. An experiment showed that the microparticles in sample would be accumulated on a fixed field on the surface of the microelectrodes caused by the AC electric field. Based on the phenomena, the velocity field of AC EO in microchannel is explored and the process of microparticles accumulated is explained. The location of microparticles accumulated is determined based on the numerical simulation results, at the same time, the rate relation between the accumulated location and the width ofmicroelectrode, which offers the theoretic base for further analyzing and detecting microparticles.

AB - AC-electroosmosis (AC EO) shows many advantages in collecting microparticles, such as low signal voltage, little sample, real-time detection and integrating in microchip easily. An experiment showed that the microparticles in sample would be accumulated on a fixed field on the surface of the microelectrodes caused by the AC electric field. Based on the phenomena, the velocity field of AC EO in microchannel is explored and the process of microparticles accumulated is explained. The location of microparticles accumulated is determined based on the numerical simulation results, at the same time, the rate relation between the accumulated location and the width ofmicroelectrode, which offers the theoretic base for further analyzing and detecting microparticles.

UR - https://www.scopus.com/pages/publications/35248872584

U2 - 10.1109/ICIEA.2007.4318409

DO - 10.1109/ICIEA.2007.4318409

M3 - 会议稿件

AN - SCOPUS:35248872584

SN - 1424407370

SN - 9781424407378

T3 - ICIEA 2007: 2007 Second IEEE Conference on Industrial Electronics and Applications

SP - 251

EP - 254

BT - ICIEA 2007

T2 - 2007 2nd IEEE Conference on Industrial Electronics and Applications, ICIEA 2007

Y2 - 23 May 2007 through 25 May 2007

ER -

Determination of the accumulated location of microparticle collection caused by AC EO

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