TY - GEN
T1 - Design of AXIe-based mixed ATS platform
AU - Jiaqing, Qiao
AU - Jia, Xianzhao
AU - Song, Xingzhe
AU - Lei, Feng
AU - Wenbo, Li
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/23
Y1 - 2017/10/23
N2 - AXie is a new standard for constructing automatic testing systems (ATS). It provides an open, high-performance platform for instrument modules. However due to some practical consideration, such as the reuse of existing modular instruments or bench top instruments, compatibility should be taken into account when constructing a new ATS based on AXIe system. In this paper we propose a mixed ATS architecture that could integrate AXIe, PXIe, LXI, and GPIB instruments together to perform one test task, which takes an AXIe system as the main function part of the ATS. A prototype system platform is build up based on the design of an AXIe backplane, an AXIe system module and a PXIe/AXIe adapter. Preliminary test results prove that the system functions well to operate AXIe instruments, PXIe instruments and PXIe subsystem.
AB - AXie is a new standard for constructing automatic testing systems (ATS). It provides an open, high-performance platform for instrument modules. However due to some practical consideration, such as the reuse of existing modular instruments or bench top instruments, compatibility should be taken into account when constructing a new ATS based on AXIe system. In this paper we propose a mixed ATS architecture that could integrate AXIe, PXIe, LXI, and GPIB instruments together to perform one test task, which takes an AXIe system as the main function part of the ATS. A prototype system platform is build up based on the design of an AXIe backplane, an AXIe system module and a PXIe/AXIe adapter. Preliminary test results prove that the system functions well to operate AXIe instruments, PXIe instruments and PXIe subsystem.
KW - AXIe
KW - AXIe backplane
KW - Mixed ATS
KW - PXIe adapter
KW - System module
UR - https://www.scopus.com/pages/publications/85038559092
U2 - 10.1109/AUTEST.2017.8080486
DO - 10.1109/AUTEST.2017.8080486
M3 - 会议稿件
AN - SCOPUS:85038559092
T3 - AUTOTESTCON (Proceedings)
BT - AUTOTESTCON 2017, Conference Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 53rd IEEE AUTOTESTCON Conference, AUTOTESTCON 2017
Y2 - 11 September 2017 through 14 September 2017
ER -