Abstract
Reviewing some past research[1-4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer. Section 1 of the full paper describes the architecture of a pipeline in the Longtium-FT1 microprocessor developed by us, which utilizes a five-stage pipeline and is shown in Fig. 1; then it analyzes the effects of SEU on Longtium-FT1 microprocessor. Section 2 designs the architecture of the direct error correction pipeline, which is shown in the block diagram in Fig. 4. Its core is: ″the pipeline uses the error detection and correction coding (EDAC) technology in register file and uses the triple module redundant (TMR) technology in distributed registers. Fig. 2 shows the structure of EDAC and Fig. 3 shows the structure of TMR with independent clock trees.″ Section 3 implements the Longtium-FT1 microprocessor, whose chip is shown in Fig. 5, and verifies it with some experiments; the experimental results show preliminarily that the Longtium-FT1 microprocessor we designed is reliable and can tolerate SEU up to 300 krads (Si).
| Original language | English |
|---|---|
| Pages (from-to) | 585-590 |
| Number of pages | 6 |
| Journal | Xibei Gongye Daxue Xuebao/Journal of Northwestern Polytechnical University |
| Volume | 28 |
| Issue number | 4 |
| State | Published - Aug 2010 |
| Externally published | Yes |
Keywords
- Chips
- Direct error correction pipeline
- Error detection and correction coding (EDAC)
- Microprocessor
- Radiation hazards
- Reliability
- Single event upset (SEU)
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