Design of a reliable cache based on grouped checking and data reloading

Danghui Wang; Ming Rui Xin

doi:10.1109/ICISE.2010.5691449

Design of a reliable cache based on grouped checking and data reloading

Danghui Wang^*
, Ming Rui Xin

^*Corresponding author for this work

Northwestern Polytechnical University Xian
Shan Dong Aerospace Electronics Institute

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

Reviewing some past research^[1-4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer. This paper proposes a reliable cache structure which is based on grouped checking and data reloading. In this structure, data and tag domain are divided into several groups to check. If there have some errors during checking, the cache accessing is identified to cache missing and to reload the right data from memory. The experimental results show preliminarily that the Longteng-FT1 microprocessor we designed is reliable and can tolerate SEU up to 300 Krads (Si).

Original language	English
Title of host publication	2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings
Pages	5051-5054
Number of pages	4
DOIs	https://doi.org/10.1109/ICISE.2010.5691449
State	Published - 2010
Externally published	Yes
Event	2nd International Conference on Information Science and Engineering, ICISE2010 - Hangzhou, China Duration: 4 Dec 2010 → 6 Dec 2010

Publication series

Name	2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings

Conference

Conference	2nd International Conference on Information Science and Engineering, ICISE2010
Country/Territory	China
City	Hangzhou
Period	4/12/10 → 6/12/10

Keywords

Cache
Data relaoding
Grouped checking
Microprocessor chips
Radiation hazards
Reliablity
Single event upset (SEU)

Access to Document

10.1109/ICISE.2010.5691449

Cite this

Wang, D., & Xin, M. R. (2010). Design of a reliable cache based on grouped checking and data reloading. In 2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings (pp. 5051-5054). Article 5691449 (2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings). https://doi.org/10.1109/ICISE.2010.5691449

@inproceedings{ecffcbfde17d470b8ef7c8c5593e2355,

title = "Design of a reliable cache based on grouped checking and data reloading",

abstract = "Reviewing some past research[1-4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer. This paper proposes a reliable cache structure which is based on grouped checking and data reloading. In this structure, data and tag domain are divided into several groups to check. If there have some errors during checking, the cache accessing is identified to cache missing and to reload the right data from memory. The experimental results show preliminarily that the Longteng-FT1 microprocessor we designed is reliable and can tolerate SEU up to 300 Krads (Si).",

keywords = "Cache, Data relaoding, Grouped checking, Microprocessor chips, Radiation hazards, Reliablity, Single event upset (SEU)",

author = "Danghui Wang and Xin, \{Ming Rui\}",

year = "2010",

doi = "10.1109/ICISE.2010.5691449",

language = "英语",

isbn = "9781424480968",

series = "2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings",

pages = "5051--5054",

booktitle = "2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings",

note = "2nd International Conference on Information Science and Engineering, ICISE2010 ; Conference date: 04-12-2010 Through 06-12-2010",

}

Wang, D & Xin, MR 2010, Design of a reliable cache based on grouped checking and data reloading. in 2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings., 5691449, 2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings, pp. 5051-5054, 2nd International Conference on Information Science and Engineering, ICISE2010, Hangzhou, China, 4/12/10. https://doi.org/10.1109/ICISE.2010.5691449

Design of a reliable cache based on grouped checking and data reloading. / Wang, Danghui; Xin, Ming Rui.
2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings. 2010. p. 5051-5054 5691449 (2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Design of a reliable cache based on grouped checking and data reloading

AU - Wang, Danghui

AU - Xin, Ming Rui

PY - 2010

Y1 - 2010

N2 - Reviewing some past research[1-4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer. This paper proposes a reliable cache structure which is based on grouped checking and data reloading. In this structure, data and tag domain are divided into several groups to check. If there have some errors during checking, the cache accessing is identified to cache missing and to reload the right data from memory. The experimental results show preliminarily that the Longteng-FT1 microprocessor we designed is reliable and can tolerate SEU up to 300 Krads (Si).

AB - Reviewing some past research[1-4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer. This paper proposes a reliable cache structure which is based on grouped checking and data reloading. In this structure, data and tag domain are divided into several groups to check. If there have some errors during checking, the cache accessing is identified to cache missing and to reload the right data from memory. The experimental results show preliminarily that the Longteng-FT1 microprocessor we designed is reliable and can tolerate SEU up to 300 Krads (Si).

KW - Cache

KW - Data relaoding

KW - Grouped checking

KW - Microprocessor chips

KW - Radiation hazards

KW - Reliablity

KW - Single event upset (SEU)

UR - https://www.scopus.com/pages/publications/79951967881

U2 - 10.1109/ICISE.2010.5691449

DO - 10.1109/ICISE.2010.5691449

M3 - 会议稿件

AN - SCOPUS:79951967881

SN - 9781424480968

T3 - 2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings

SP - 5051

EP - 5054

BT - 2nd International Conference on Information Science and Engineering, ICISE2010 - Proceedings

T2 - 2nd International Conference on Information Science and Engineering, ICISE2010

Y2 - 4 December 2010 through 6 December 2010

ER -

Design of a reliable cache based on grouped checking and data reloading

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Keywords

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