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Design of a novel high performance digital fault recorder

  • Harbin Institute of Technology
  • Jilin Institute of Chemical Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Power quality is the most important problems in power system automation. Aim to analysis and improve the power quality, many types of power quality events, such as voltage unbalanced, harmonic, frequency offset and multiple short time power quality disturbances, should be recorded accurately. This paper proposed a new design proposal of a novel digital fault recorder which could record the power quality waveform signals in 24 hours a day. The original power quality signals are transformed by fast Fourier transforms (FFT) and the waveform distortion is determined by the amplitude spectrum. In order to compression the data of power quality signals, the waveform without distortion is described by the first circle's waveform. Hence, every power quality events signals and stationary signals will be recorded by one circle signal of each time. Then, the first circle signals of each event are compressed by wavelet transform so as to get higher compression ratio. The signal compressed by DFR will be stored in the Flash or RAM chips and transferred to principal computer. The data will be used for power quality analysis.

Original languageEnglish
Title of host publicationProgress in Measurement and Testing
Pages470-475
Number of pages6
Edition1
DOIs
StatePublished - 2010
Event2010 International Conference on Advanced Measurement and Test, AMT 2010 - Sanya, China
Duration: 15 May 201016 May 2010

Publication series

NameAdvanced Materials Research
Number1
Volume108-111
ISSN (Print)1022-6680

Conference

Conference2010 International Conference on Advanced Measurement and Test, AMT 2010
Country/TerritoryChina
CitySanya
Period15/05/1016/05/10

Keywords

  • Data compression
  • Digital fault recorder
  • Fast Fourier transforms (FFT)
  • Power quality
  • Power quality disturbance
  • Power quality event
  • Wavelet transform (WT)

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