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Defect evolution on the optical properties of H+-implanted ZnO whiskers

  • Jinpeng Lv
  • , Chundong Li*
  • , J. J. Belbruno
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Dartmouth College

Research output: Contribution to journalArticlepeer-review

Abstract

The interplay of intentionally doped H impurity with native defects as well as its influence on the microstructure and optical properties of ZnO whiskers was systematically studied by varying the H+ implantation fluencies from 1 × 1014 to 1 × 1016 ions cm -2. Higher dose of H+ implantation resulted in the serious deterioration of the crystallinity and introduction of more nonradiative V O and Zni defects in the energy gap, as revealed by the X-ray diffraction (XRD), absorption spectra, Raman scattering, photoluminescence and electronic paramagnetic resonance (EPR) measurements. We demonstrate that H passivation of oxygen vacancies is in terms of forming V+0 defects rather than H+0 while deactivation of zinc vacancy related acceptor defects is through the process of hydrogen filling. The V+0 and ionized Zni defects are suggested to give rise to the H+-implantation induced blue band optical absorption.

Original languageEnglish
Pages (from-to)5620-5625
Number of pages6
JournalCrystEngComm
Volume15
Issue number28
DOIs
StatePublished - 28 Jul 2013
Externally publishedYes

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