Abstract
The interplay of intentionally doped H impurity with native defects as well as its influence on the microstructure and optical properties of ZnO whiskers was systematically studied by varying the H+ implantation fluencies from 1 × 1014 to 1 × 1016 ions cm -2. Higher dose of H+ implantation resulted in the serious deterioration of the crystallinity and introduction of more nonradiative V O and Zni defects in the energy gap, as revealed by the X-ray diffraction (XRD), absorption spectra, Raman scattering, photoluminescence and electronic paramagnetic resonance (EPR) measurements. We demonstrate that H passivation of oxygen vacancies is in terms of forming V+0 defects rather than H+0 while deactivation of zinc vacancy related acceptor defects is through the process of hydrogen filling. The V+0 and ionized Zni defects are suggested to give rise to the H+-implantation induced blue band optical absorption.
| Original language | English |
|---|---|
| Pages (from-to) | 5620-5625 |
| Number of pages | 6 |
| Journal | CrystEngComm |
| Volume | 15 |
| Issue number | 28 |
| DOIs | |
| State | Published - 28 Jul 2013 |
| Externally published | Yes |
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