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Data-Free Backdoor Model Inspection: Masking and Reverse Engineering Loops for Feature Counting

  • Qi Zhou*
  • , Wenjian Luo
  • , Zipeng Ye
  • , Yubo Tang
  • *Corresponding author for this work
  • School of Computer Science and Technology, Harbin Institute of Technology
  • Peng Cheng Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Deep Neural Networks (DNNs) are widely used for the outstanding performance in many fields. However, the training of DNN models has high requirements for the users' data and computation resources, so many users with limited resources tend to download pre-trained models from some platforms and then finetune the pre-trained models to match their own tasks. However, the pre-trained models are under the threat of the backdoor attack. The backdoor attackers inject backdoors in the models, leading the backdoor models to predict target predictions designed by the attackers in advance. However, most existing backdoor model inspection methods rely on the clean data samples from the dataset of the model, which are difficult to get for users who just download the pre-trained models from the platforms. There are also a few defense methods not dependent on the data, but they also have their limits in practice. We propose Data-Free Masking and Reverse Engineering Loops (DF-MREL), a simple yet efficient data-free method for backdoor model inspection, which is widely applicable when resources are limited. Our experiments show its excellent performance in detecting backdoor models. Source code will be published after accepted.

Original languageEnglish
Title of host publication2024 International Joint Conference on Neural Networks, IJCNN 2024 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350359312
DOIs
StatePublished - 2024
Externally publishedYes
Event2024 International Joint Conference on Neural Networks, IJCNN 2024 - Yokohama, Japan
Duration: 30 Jun 20245 Jul 2024

Publication series

NameProceedings of the International Joint Conference on Neural Networks

Conference

Conference2024 International Joint Conference on Neural Networks, IJCNN 2024
Country/TerritoryJapan
CityYokohama
Period30/06/245/07/24

Keywords

  • Deep Neural Network
  • backdoor inspection
  • data-free
  • masking
  • reverse engineering

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