TY - GEN
T1 - Data-driven Fault Diagnosis Scheme for Complex Integrated Control Systems
AU - An, Baoran
AU - Wu, Huai
AU - Yin, Shen
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - From 13th national five-year to 15th five-year development period, the new generation of scientific facilities is under construction in China. Control systems are critical for the safety operation of novel scientific facilities. The traditional fault diagnosis technology based on analytical models is not applicable to complex process. In the paper, the data-driven fault diagnosis scheme under three complex conditions including nonlinear controlled process, non-Gaussian noise and incomplete information is analyzed in depth. Finally, the components and elements of simulation verification environment are given.
AB - From 13th national five-year to 15th five-year development period, the new generation of scientific facilities is under construction in China. Control systems are critical for the safety operation of novel scientific facilities. The traditional fault diagnosis technology based on analytical models is not applicable to complex process. In the paper, the data-driven fault diagnosis scheme under three complex conditions including nonlinear controlled process, non-Gaussian noise and incomplete information is analyzed in depth. Finally, the components and elements of simulation verification environment are given.
UR - https://www.scopus.com/pages/publications/85062508297
U2 - 10.1109/WCICA.2018.8630563
DO - 10.1109/WCICA.2018.8630563
M3 - 会议稿件
AN - SCOPUS:85062508297
T3 - Proceedings of the World Congress on Intelligent Control and Automation (WCICA)
SP - 1255
EP - 1258
BT - Proceedings of the 2018 13th World Congress on Intelligent Control and Automation, WCICA 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th World Congress on Intelligent Control and Automation, WCICA 2018
Y2 - 4 July 2018 through 8 July 2018
ER -