Abstract
The crystallization kinetics of NixTi1-x (x=53.5, 48.1, and 42.9) alloy thin films have been investigated by means of differential scanning calorimeter under nonisothermal conditions. The onset crystallization temperature Tx, crystallization peak temperature Tp and effective activation energy Ec of NixTi1-x alloy thin films are found to depend on the average heating rate and thin films composition during the continuous heating. The effective activation energy and the frequency factor are determined by the Kissinger method. The effects of composition and heating rate for NiTi thin films on crystallization have been discussed in view of the mobility of atom cluster.
| Original language | English |
|---|---|
| Pages (from-to) | 947-950 |
| Number of pages | 4 |
| Journal | Physica B: Condensed Matter |
| Volume | 405 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1 Feb 2010 |
| Externally published | Yes |
Keywords
- Amorphous thin films
- Crystallization kinetics
- Effects of heating rate
- TiNi
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