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Crystallization kinetics of NixTi1-x alloy thin films

  • Yongchao Lei
  • , Hui Jie Zhao
  • , Wei Cai*
  • , Xu An
  • , Laixu Gao
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Heilongjiang University

Research output: Contribution to journalArticlepeer-review

Abstract

The crystallization kinetics of NixTi1-x (x=53.5, 48.1, and 42.9) alloy thin films have been investigated by means of differential scanning calorimeter under nonisothermal conditions. The onset crystallization temperature Tx, crystallization peak temperature Tp and effective activation energy Ec of NixTi1-x alloy thin films are found to depend on the average heating rate and thin films composition during the continuous heating. The effective activation energy and the frequency factor are determined by the Kissinger method. The effects of composition and heating rate for NiTi thin films on crystallization have been discussed in view of the mobility of atom cluster.

Original languageEnglish
Pages (from-to)947-950
Number of pages4
JournalPhysica B: Condensed Matter
Volume405
Issue number3
DOIs
StatePublished - 1 Feb 2010
Externally publishedYes

Keywords

  • Amorphous thin films
  • Crystallization kinetics
  • Effects of heating rate
  • TiNi

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