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Concentration protile of etchant measured by microelectrode technique in the process of chemical micromachining

  • Jing Tang*
  • , Xin Zhou Ma
  • , Hui Zhong He
  • , Li Zhang
  • , Mi Xuan Lin
  • , Dong Sheng Qu
  • , Qing Yong Ding
  • , Li Ning Sun
  • *Corresponding author for this work
  • Xiamen University
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

A carbon-disk microelectrode was used to investigate the surface concentration profile of etchant Br2, which was electrogenerated on the Pt working electrode. The steady state reducing currents of Br2 at different distances away from the Pt electode was measured. The concentration profile was estimated from the current-distance variation curves as a function of different sampling times. Experimentally determined concentration profiles are in good agreement with those estimated from the microetching results. The microelectrode technique has offered a good method to choose suitable etching solution for chemical micromachining.

Original languageEnglish
Pages (from-to)507-512
Number of pages6
JournalWuli Huaxue Xuebao/ Acta Physico - Chimica Sinica
Volume22
Issue number4
StatePublished - Apr 2006

Keywords

  • Concentration profile
  • Confined etchant layer technique (CELT)
  • GaAs
  • L-cystine
  • Microelectrode

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