Abstract
A carbon-disk microelectrode was used to investigate the surface concentration profile of etchant Br2, which was electrogenerated on the Pt working electrode. The steady state reducing currents of Br2 at different distances away from the Pt electode was measured. The concentration profile was estimated from the current-distance variation curves as a function of different sampling times. Experimentally determined concentration profiles are in good agreement with those estimated from the microetching results. The microelectrode technique has offered a good method to choose suitable etching solution for chemical micromachining.
| Original language | English |
|---|---|
| Pages (from-to) | 507-512 |
| Number of pages | 6 |
| Journal | Wuli Huaxue Xuebao/ Acta Physico - Chimica Sinica |
| Volume | 22 |
| Issue number | 4 |
| State | Published - Apr 2006 |
Keywords
- Concentration profile
- Confined etchant layer technique (CELT)
- GaAs
- L-cystine
- Microelectrode
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