TY - GEN
T1 - Complex-amplitude metalens with extended depth of focus and enhanced focal uniformity
AU - Wang, Rui
AU - Mu, Yongheng
AU - Du, Zhou
AU - Qiu, Jinghui
AU - Qi, Jiaran
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Deep depth of focus (DoF) metalenses have wide application prospects in the fields of security inspection, biological observation, and 3D imaging. However, prevailing design approaches have inherent defects such as numerical aperture (NA) constraints and poor focal uniformity. To conquer these limitations, a complex-amplitude (CA) deep DoF metalens is demonstrated in the microwave region, enabled by the marriage of a novel 3D CA retrieval method and the C-shaped meta-atoms. An extended DoF of 6.9λ can be simulated, corresponding to the NA range from 0.8725 to 0.4582. Meanwhile, the lateral focal spot is uniformly distributed longitudinally, with the variance value of 21.03 in the focal spot diameter. The proposed retrieval method can provide an optimized design strategy for the deep DoF metalens, ensuring the DoF accuracy and the focal uniformity. The numerical comparison results prove the validity and superiority of this method.
AB - Deep depth of focus (DoF) metalenses have wide application prospects in the fields of security inspection, biological observation, and 3D imaging. However, prevailing design approaches have inherent defects such as numerical aperture (NA) constraints and poor focal uniformity. To conquer these limitations, a complex-amplitude (CA) deep DoF metalens is demonstrated in the microwave region, enabled by the marriage of a novel 3D CA retrieval method and the C-shaped meta-atoms. An extended DoF of 6.9λ can be simulated, corresponding to the NA range from 0.8725 to 0.4582. Meanwhile, the lateral focal spot is uniformly distributed longitudinally, with the variance value of 21.03 in the focal spot diameter. The proposed retrieval method can provide an optimized design strategy for the deep DoF metalens, ensuring the DoF accuracy and the focal uniformity. The numerical comparison results prove the validity and superiority of this method.
KW - complex-amplitude retrieval
KW - deep of focus
KW - focal uniformity
KW - metalens
KW - numerical aperture
UR - https://www.scopus.com/pages/publications/85146256843
U2 - 10.1109/IWS55252.2022.9978142
DO - 10.1109/IWS55252.2022.9978142
M3 - 会议稿件
AN - SCOPUS:85146256843
T3 - 2022 IEEE MTT-S International Wireless Symposium, IWS 2022 - Proceedings
BT - 2022 IEEE MTT-S International Wireless Symposium, IWS 2022 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th IEEE MTT-S International Wireless Symposium, IWS 2022
Y2 - 12 August 2022 through 15 August 2022
ER -