Combined contributions of phase structure and preferred orientation on the piezoelectric properties of polycrystalline (Pb0.94La0.04) Zr0.6Ti0.4O3 thin films

Siqi Zhang; Weili Li; Chenfei Jin; Weidong Fei

doi:10.1016/j.matlet.2015.07.161

Combined contributions of phase structure and preferred orientation on the piezoelectric properties of polycrystalline (Pb_0.94La_0.04) Zr_0.6Ti_0.4O₃ thin films

Siqi Zhang
, Weili Li
, Chenfei Jin
, Weidong Fei^*

^*Corresponding author for this work

School of Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Abstract Polycrystalline (Pb_0.94La_0.04) Zr_0.6Ti_0.4O₃ thin films were fabricated by a sol-gel method on the Pt (111)/Ti/SiO₂/Si (100) substrates. Results from X-ray diffraction reveal that a strain-induced low-asymmetry monoclinic (M_B) phase exists in all the films as compared with its powder counterpart. Also, films exhibit a simple trend of pyrolysis-sensitive (100)-orient growth. Good piezoelectric longitudinal coefficient values are obtained in the films where a maximum around 130 pm/V is reached for the film pyrolyzing at 425 °C. These findings suggest that combined contributions of monoclinic phase and (100)-preferred orientation type as well as good surface quality will account for excellent piezoelectric properties for ferroelectric films.

Original language	English
Article number	19359
Pages (from-to)	347-350
Number of pages	4
Journal	Materials Letters
Volume	160
DOIs	https://doi.org/10.1016/j.matlet.2015.07.161
State	Published - 11 Aug 2015

Keywords

AFM
Crystal Structure
Ferroelectric ceramics
Piezoelectricity
Preferred Orientation

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10.1016/j.matlet.2015.07.161

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@article{c7d9039b79ca4e95b76aebf64203d041,

title = "Combined contributions of phase structure and preferred orientation on the piezoelectric properties of polycrystalline (Pb0.94La0.04) Zr0.6Ti0.4O3 thin films",

abstract = "Abstract Polycrystalline (Pb0.94La0.04) Zr0.6Ti0.4O3 thin films were fabricated by a sol-gel method on the Pt (111)/Ti/SiO2/Si (100) substrates. Results from X-ray diffraction reveal that a strain-induced low-asymmetry monoclinic (MB) phase exists in all the films as compared with its powder counterpart. Also, films exhibit a simple trend of pyrolysis-sensitive (100)-orient growth. Good piezoelectric longitudinal coefficient values are obtained in the films where a maximum around 130 pm/V is reached for the film pyrolyzing at 425 °C. These findings suggest that combined contributions of monoclinic phase and (100)-preferred orientation type as well as good surface quality will account for excellent piezoelectric properties for ferroelectric films.",

keywords = "AFM, Crystal Structure, Ferroelectric ceramics, Piezoelectricity, Preferred Orientation",

author = "Siqi Zhang and Weili Li and Chenfei Jin and Weidong Fei",

note = "Publisher Copyright: {\textcopyright} 2015 Published by Elsevier B.V.",

year = "2015",

month = aug,

day = "11",

doi = "10.1016/j.matlet.2015.07.161",

language = "英语",

volume = "160",

pages = "347--350",

journal = "Materials Letters",

issn = "0167-577X",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Combined contributions of phase structure and preferred orientation on the piezoelectric properties of polycrystalline (Pb0.94La0.04) Zr0.6Ti0.4O3 thin films

AU - Zhang, Siqi

AU - Li, Weili

AU - Jin, Chenfei

AU - Fei, Weidong

PY - 2015/8/11

Y1 - 2015/8/11

N2 - Abstract Polycrystalline (Pb0.94La0.04) Zr0.6Ti0.4O3 thin films were fabricated by a sol-gel method on the Pt (111)/Ti/SiO2/Si (100) substrates. Results from X-ray diffraction reveal that a strain-induced low-asymmetry monoclinic (MB) phase exists in all the films as compared with its powder counterpart. Also, films exhibit a simple trend of pyrolysis-sensitive (100)-orient growth. Good piezoelectric longitudinal coefficient values are obtained in the films where a maximum around 130 pm/V is reached for the film pyrolyzing at 425 °C. These findings suggest that combined contributions of monoclinic phase and (100)-preferred orientation type as well as good surface quality will account for excellent piezoelectric properties for ferroelectric films.

AB - Abstract Polycrystalline (Pb0.94La0.04) Zr0.6Ti0.4O3 thin films were fabricated by a sol-gel method on the Pt (111)/Ti/SiO2/Si (100) substrates. Results from X-ray diffraction reveal that a strain-induced low-asymmetry monoclinic (MB) phase exists in all the films as compared with its powder counterpart. Also, films exhibit a simple trend of pyrolysis-sensitive (100)-orient growth. Good piezoelectric longitudinal coefficient values are obtained in the films where a maximum around 130 pm/V is reached for the film pyrolyzing at 425 °C. These findings suggest that combined contributions of monoclinic phase and (100)-preferred orientation type as well as good surface quality will account for excellent piezoelectric properties for ferroelectric films.

KW - AFM

KW - Crystal Structure

KW - Ferroelectric ceramics

KW - Piezoelectricity

KW - Preferred Orientation

UR - https://www.scopus.com/pages/publications/84938821248

U2 - 10.1016/j.matlet.2015.07.161

DO - 10.1016/j.matlet.2015.07.161

M3 - 文章

AN - SCOPUS:84938821248

SN - 0167-577X

VL - 160

SP - 347

EP - 350

JO - Materials Letters

JF - Materials Letters

M1 - 19359

ER -

Combined contributions of phase structure and preferred orientation on the piezoelectric properties of polycrystalline (Pb_0.94La_0.04) Zr_0.6Ti_0.4O₃ thin films

Abstract

Keywords

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