Code acquisition using the locally optimum test statistics in both multiplicative and additive noises

Shen Feng; Gai Meng; Wang Zhao-Long; Li Zhi-Qiang

doi:10.1109/ICMA.2011.5985827

Code acquisition using the locally optimum test statistics in both multiplicative and additive noises

Shen Feng^*
, Gai Meng
, Wang Zhao-Long
, Li Zhi-Qiang

^*Corresponding author for this work

Harbin Engineering University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Multiplicative noise is known to be useful in modeling some environments, which is difficult to describe by additive noise model. In this paper, the pseudo noise (PN) code acquisition in multiplicative and additive noises is considered. Modeling the acquisition problem as a hypothesis testing problem, a new detector is proposed for multiplicative noise, based on the locally optimum detection technique. To reducing the complexity of the proposed detector, a simpler detector is derived. Numerical results show that the proposed detector can offer substantial performance improvement over the conventional schemes in multiplicative and additive noises.

Original language	English
Title of host publication	2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011
Pages	1174-1178
Number of pages	5
DOIs	https://doi.org/10.1109/ICMA.2011.5985827
State	Published - 2011
Externally published	Yes
Event	2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011 - Beijing, China Duration: 7 Aug 2011 → 10 Aug 2011

Publication series

Name	2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011

Conference

Conference	2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011
Country/Territory	China
City	Beijing
Period	7/08/11 → 10/08/11

Keywords

PN code acquisition
locally optimum detection
multiplicative and additive noises

Access to Document

10.1109/ICMA.2011.5985827

Cite this

Feng, S., Meng, G., Zhao-Long, W., & Zhi-Qiang, L. (2011). Code acquisition using the locally optimum test statistics in both multiplicative and additive noises. In 2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011 (pp. 1174-1178). Article 5985827 (2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011). https://doi.org/10.1109/ICMA.2011.5985827

@inproceedings{690ff3bebe61481ca8bced7d2d1bd11d,

title = "Code acquisition using the locally optimum test statistics in both multiplicative and additive noises",

abstract = "Multiplicative noise is known to be useful in modeling some environments, which is difficult to describe by additive noise model. In this paper, the pseudo noise (PN) code acquisition in multiplicative and additive noises is considered. Modeling the acquisition problem as a hypothesis testing problem, a new detector is proposed for multiplicative noise, based on the locally optimum detection technique. To reducing the complexity of the proposed detector, a simpler detector is derived. Numerical results show that the proposed detector can offer substantial performance improvement over the conventional schemes in multiplicative and additive noises.",

keywords = "PN code acquisition, locally optimum detection, multiplicative and additive noises",

author = "Shen Feng and Gai Meng and Wang Zhao-Long and Li Zhi-Qiang",

year = "2011",

doi = "10.1109/ICMA.2011.5985827",

language = "英语",

isbn = "9781424481149",

series = "2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011",

pages = "1174--1178",

booktitle = "2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011",

note = "2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011 ; Conference date: 07-08-2011 Through 10-08-2011",

}

Feng, S, Meng, G, Zhao-Long, W & Zhi-Qiang, L 2011, Code acquisition using the locally optimum test statistics in both multiplicative and additive noises. in 2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011., 5985827, 2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011, pp. 1174-1178, 2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011, Beijing, China, 7/08/11. https://doi.org/10.1109/ICMA.2011.5985827

Code acquisition using the locally optimum test statistics in both multiplicative and additive noises. / Feng, Shen; Meng, Gai; Zhao-Long, Wang et al.
2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011. 2011. p. 1174-1178 5985827 (2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Feng, Shen

AU - Meng, Gai

AU - Zhao-Long, Wang

AU - Zhi-Qiang, Li

PY - 2011

Y1 - 2011

N2 - Multiplicative noise is known to be useful in modeling some environments, which is difficult to describe by additive noise model. In this paper, the pseudo noise (PN) code acquisition in multiplicative and additive noises is considered. Modeling the acquisition problem as a hypothesis testing problem, a new detector is proposed for multiplicative noise, based on the locally optimum detection technique. To reducing the complexity of the proposed detector, a simpler detector is derived. Numerical results show that the proposed detector can offer substantial performance improvement over the conventional schemes in multiplicative and additive noises.

AB - Multiplicative noise is known to be useful in modeling some environments, which is difficult to describe by additive noise model. In this paper, the pseudo noise (PN) code acquisition in multiplicative and additive noises is considered. Modeling the acquisition problem as a hypothesis testing problem, a new detector is proposed for multiplicative noise, based on the locally optimum detection technique. To reducing the complexity of the proposed detector, a simpler detector is derived. Numerical results show that the proposed detector can offer substantial performance improvement over the conventional schemes in multiplicative and additive noises.

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DO - 10.1109/ICMA.2011.5985827

M3 - 会议稿件

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SN - 9781424481149

T3 - 2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011

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BT - 2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011

T2 - 2011 IEEE International Conference on Mechatronics and Automation, ICMA 2011

Y2 - 7 August 2011 through 10 August 2011

ER -

Code acquisition using the locally optimum test statistics in both multiplicative and additive noises

Abstract

Publication series

Conference

Keywords

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