Characterization the pinpoint damage resistance of tripler (D)KDP crystals with 3D local registering method

(D)KDP nonlinear crystals in ICF drivers are susceptible to laser-induced pinpoint damage, therefore significant effort has been focused on characterizing pinpoint damage in order to better prevent, reduce, and/or even manage pinpoint damage. However, non-uniform beam distribution has long been recognized as a key factor resulting in the discrepancies between offline damage testing and online damage performance. This work proposes the 3D local registering method for evaluating the pinpoint damage resistance of (D)KDP crystals, which effectively mitigates the influence of non-uniform beam distribution. This technique is particularly suitable for size-constrained samples damage testing with high-efficiency and high-accuracy, in which the pinpoint damage resistance of crystal can be microscopically characterized with only one shot laser exposure on single test region.