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Characterization of the transient thermal-lens effect using top-hat beam Z-scan

  • Soochow University
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The transient thermal-lens effect in a solution is investigated by using the top-hat beam Z-scan technique. The numerical results show that the sensitivity of the top-hat beam Z-scan measurements is about 3.5 times greater than the Gaussian beams for the transient thermal-lens effect when the phase shift is small, which is greater than that for the Kerr effect and the steady-state thermal-lens effect. The reasons are also discussed in detail.

Original languageEnglish
Article number225404
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume42
Issue number22
DOIs
StatePublished - 2009

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