Abstract
The transient thermal-lens effect in a solution is investigated by using the top-hat beam Z-scan technique. The numerical results show that the sensitivity of the top-hat beam Z-scan measurements is about 3.5 times greater than the Gaussian beams for the transient thermal-lens effect when the phase shift is small, which is greater than that for the Kerr effect and the steady-state thermal-lens effect. The reasons are also discussed in detail.
| Original language | English |
|---|---|
| Article number | 225404 |
| Journal | Journal of Physics B: Atomic, Molecular and Optical Physics |
| Volume | 42 |
| Issue number | 22 |
| DOIs | |
| State | Published - 2009 |
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