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Characterization of inner surface roughness for ICF capsules by backlit shadowgraphy

  • Yuanqiong Liu
  • , Xuesen Zhao
  • , Haile Lei
  • , Duan Xie
  • , Dangzhong Gao*
  • *Corresponding author for this work
  • China Academy of Engineering Physics

Research output: Contribution to journalArticlepeer-review

Abstract

A backlit shadowgraphy technique has been developed, which can be used for nondestructive characterization of ice layer's inner surface quality for transparent ICF capsules. The physics of the bright band formation for single-layer shell is analyzed by optical theory. With raytrace code, Tracepro, simulated shadowgraphs of transparent single-layer shells are produced to investigate the relation between bright-band position and thickness or refractive index of shells. A setup has been established for backlit shadowgraphy, and experimental shadowgraphs of transparent single-layer shells are obtained, which have a distinct bright band. A code has been developed to analyze shadowgraphs, and the shell's inner surface power spectrum (1-D) is obtained, then its RMS surface roughness is calculated. These analyses in theory, simulation and experimental results prove the validity of the technique.

Original languageEnglish
Pages (from-to)2880-2884
Number of pages5
JournalQiangjiguang Yu Lizishu/High Power Laser and Particle Beams
Volume22
Issue number12
DOIs
StatePublished - Dec 2010

Keywords

  • Backlit shadowgraphy
  • Geometrical optics
  • ICF capsule
  • Power spectrum analysis
  • Surface roughness

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