Characterization of fiber texture by ω -scan x-ray diffraction

On the basis of ω -scan x-ray diffraction (XRD), quantitative and qualitative characterization methods for fiber texture are proposed. The physical meaning of ω -scan curve is discussed in detail, and it is shown that the relative intensity curve of ω -scan XRD for a certain crystal plane is proportional to the pole density of the plane. Then qualitative and quantitative characterization methods for fiber texture are proposed from the concept of pole density. The proposed methods can be used in any crystal system. As an example for experimental verification, an orientation distribution function (ODF) experiment and a series of ω -scan XRD experiments are performed on a sputtered platinum film. From the comparison between the result of the ODF experiment and that of the analyses on the ω -scan XRD experiments, it is proved that the proposed qualitative and quantitative methods are effective and simple.