Skip to main navigation Skip to search Skip to main content

Characterization Methods of Subsurface Cracks in Grinding of Optical Elements

  • School of Mechatronics Engineering, Harbin Institute of Technology

Research output: Contribution to journalConference articlepeer-review

Abstract

In this paper, the subsurface cracks of fused silica introduced in grinding were detected by taper polishing method, and then characterized by the maximum depth, the cluster depth, and the density of cracks. The quantitative relationship between maximum depth and cluster depth of subsurface cracks was determined, and the distribution of subsurface crack density along the depth was studied. The results showed that the abrasive grain size had a great influence on maximum depth and cluster depth of subsurface cracks, while the grinding fluid concentration had little effect on them. The different processing parameters changed maximum depth and cluster depth, but their ratio was almost unchanged. The subsurface crack density decreased exponentially along the depth, and the decrease trend had slowed down significantly at the half of cluster depth.

Original languageEnglish
Article number012025
JournalIOP Conference Series: Materials Science and Engineering
Volume250
Issue number1
DOIs
StatePublished - 22 Oct 2017
Externally publishedYes
Event3rd Annual International Workshop on Materials Science and Engineering, IWMSE 2017 - Guangzhou, Guangdong, China
Duration: 8 Sep 201710 Sep 2017

Fingerprint

Dive into the research topics of 'Characterization Methods of Subsurface Cracks in Grinding of Optical Elements'. Together they form a unique fingerprint.

Cite this