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Characteristics of interfacial microstructure of PBGA solder bump during multi-reflow and aging processes

  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Characteristics of intermetallic compounds at the interface of PBGA solder ball and Au/Ni/Cu metallization on BT substrate during multi-reflow and aging processes was presented. The eutectic SnPb solder bump was formed by laser reflow first, followed by a secondary infrared reflow process to form solder joint, and then the solder joint was aged at 160°C for various numbers of days; finally, the aged solder joint was reflowed once again. During first laser reflow, the morphology and distribution of AuSn4 IMC were strongly dependent on the laser reflow power and heating time applied, and both changed after the secondary infrared reflow process. The AuSn4 layer formed at the interface in the first laser reflow process dissolved partially after the secondary infrared reflow process, and AuSn4 particles precipitated out at the eutectic cell boundary of the solder. After the aging process, AuSn4 IMC converted into Au-Ni-Sn ternary compounds, and a continuous Ni3Sn4 layer grew out under the Au-Ni-Sn IMC layer. The thickness of Au-Ni-Sn and the Ni3Sn4 IMC layer increased as the aging time increased. When the aged solder joint was reflowed again, the Au-Ni-Sn IMC disappeared at the interface, and continuous Ni3Sn4 IMC transformed to scallop-type morphology.

Original languageEnglish
Title of host publicationICEPT 2003 - 5th International Conference on Electronic Packaging Technology, Proceedings
EditorsKeyun Bi, Peter G. Barnwell, Jiaji Wang
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages260-264
Number of pages5
ISBN (Electronic)0780381688, 9780780381681
DOIs
StatePublished - 2003
Event5th International Conference on Electronic Packaging Technology, ICEPT 2003 - Shanghai, China
Duration: 28 Oct 200330 Oct 2003

Publication series

NameICEPT 2003 - 5th International Conference on Electronic Packaging Technology, Proceedings

Conference

Conference5th International Conference on Electronic Packaging Technology, ICEPT 2003
Country/TerritoryChina
CityShanghai
Period28/10/0330/10/03

Keywords

  • Aging
  • Gold
  • Infrared heating
  • Intermetallic
  • Laser transitions
  • Microstructure
  • Morphology
  • Power lasers
  • Soldering
  • Tin

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