Abstract
Ordinary AFM probes' characters prevent the AFM's application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicate that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it is also found that carbon nanotube probes can accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect.
| Original language | English |
|---|---|
| Pages (from-to) | 223-227 |
| Number of pages | 5 |
| Journal | Journal of Harbin Institute of Technology (New Series) |
| Volume | 11 |
| Issue number | 2 |
| State | Published - Apr 2004 |
Keywords
- Atomic force microscope (AFM)
- Carbon nanotube
- Probe
Fingerprint
Dive into the research topics of 'Carbon nanotubes as tips for atomic force microscopy'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver