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Capacitance sensitivity distributions model and image reconstruction in electrical capacitance tomography

  • Deyun Chen*
  • , Guibin Zheng
  • , Xiaoyang Yu
  • *Corresponding author for this work
  • Harbin University of Science and Technology

Research output: Contribution to journalConference articlepeer-review

Abstract

In this paper a software method for electrical capacitance sensor design of electrical capacitance tomography system is presented by using finite element analysis techniques. Electrical capacitance sensor theory model is established, and capacitance sensitivity field distribution and structure parameters of the sensor to measurement effect are analyzed by the method. The optimized design and simulation of electrical capacitance sensor is based on the method, and performances of electrical capacitance sensor are improved clearly, satisfactory images can be reconstructed by using the capacitance sensitivity distributions as a priori information. It provides powerful support for further application research.

Original languageEnglish
Pages (from-to)686-690
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4710
DOIs
StatePublished - 2002
Externally publishedYes
EventThermosense XXIV - Orlando, FL, United States
Duration: 1 Apr 20024 Apr 2002

Keywords

  • Capacitance Sensitivity Distributions
  • Electrical Capacitance Tomography
  • Finite Element Method
  • Image Reconstruction

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