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Calibration of FT-IR spectral emissivity measurement at ultra-high temperature

  • Zong Wei Wang*
  • , Jing Min Dai
  • , Xiao Wa He
  • , Chun Ling Yang
  • , Wei Dong Pan
  • *Corresponding author for this work
  • School of Electrical Engineering and Automation, Harbin Institute of Technology
  • China Aerospace Science and Technology Corporation

Research output: Contribution to journalArticlepeer-review

Abstract

To correct measurement errors in spectral emissivity measurement based on FT-IR in the vacuum ambient, the emissivity calibration model has been constructed, including radiation thermal losses, one dimension heat transfer and radiation thermometry. The emissivity error has been quantitatively analyzed. The results show that the higher the sample temperature is, the lower is the value of the emissivity. This result is induced by thermal losses, material thermal conductivity and sample thickness. To reduce the error induced by these factors, the system should be calibrated. The calibrated spectral emissivity of high-purity graphite sample at 2000°C agrees very well with the results reported by G. Neuer and G. Jaroma-Weiland.

Original languageEnglish
Pages (from-to)367-371+388
JournalHongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume29
Issue number5
DOIs
StatePublished - Oct 2010
Externally publishedYes

Keywords

  • FT-IR
  • Spectral emissivity
  • Temperature gradient
  • Thermal conductivity
  • True temperature

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