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BPUFuzzer: Effective Fuzz Testing for Branching Transient Execution Vulnerabilities of RISC-V CPU

  • Rihui Sun
  • , Jin Wu
  • , Hanyin Liu
  • , Zikang Tao
  • , Gang Qu
  • , Dongsheng Wang
  • , Yongqiang Lyu
  • , Jian Dong*
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • University of Maryland, College Park
  • Tsinghua University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents BPUFuzzer, a fuzz testing tool for detecting branching transient execution vulnerabilities in CPU RTL design. BPUFuzzer addresses two key challenges: generating testcases that capture complex control flows, and extracting essential data from vast hardware states to guide testcase selection. Utilizing a control flow graph-based testcase generation strategy with anomaly detection and employing fitness and coverage metrics, BPUFuzzer works on testcases that cover broader program flows and deliberately selects testcases to discover transient execution vulnerabilities effectively. When applied on RISC-V Boom v3, BPUFuzzer uncovered more Spectre types than the state-of-the-arts, including a previously unidentified variant, named Spectre-LOOP.

Original languageEnglish
Title of host publication2025 62nd ACM/IEEE Design Automation Conference, DAC 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331503048
DOIs
StatePublished - 2025
Event62nd ACM/IEEE Design Automation Conference, DAC 2025 - San Francisco, United States
Duration: 22 Jun 202525 Jun 2025

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Conference

Conference62nd ACM/IEEE Design Automation Conference, DAC 2025
Country/TerritoryUnited States
CitySan Francisco
Period22/06/2525/06/25

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