TY - GEN
T1 - BPUFuzzer
T2 - 62nd ACM/IEEE Design Automation Conference, DAC 2025
AU - Sun, Rihui
AU - Wu, Jin
AU - Liu, Hanyin
AU - Tao, Zikang
AU - Qu, Gang
AU - Wang, Dongsheng
AU - Lyu, Yongqiang
AU - Dong, Jian
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - This paper presents BPUFuzzer, a fuzz testing tool for detecting branching transient execution vulnerabilities in CPU RTL design. BPUFuzzer addresses two key challenges: generating testcases that capture complex control flows, and extracting essential data from vast hardware states to guide testcase selection. Utilizing a control flow graph-based testcase generation strategy with anomaly detection and employing fitness and coverage metrics, BPUFuzzer works on testcases that cover broader program flows and deliberately selects testcases to discover transient execution vulnerabilities effectively. When applied on RISC-V Boom v3, BPUFuzzer uncovered more Spectre types than the state-of-the-arts, including a previously unidentified variant, named Spectre-LOOP.
AB - This paper presents BPUFuzzer, a fuzz testing tool for detecting branching transient execution vulnerabilities in CPU RTL design. BPUFuzzer addresses two key challenges: generating testcases that capture complex control flows, and extracting essential data from vast hardware states to guide testcase selection. Utilizing a control flow graph-based testcase generation strategy with anomaly detection and employing fitness and coverage metrics, BPUFuzzer works on testcases that cover broader program flows and deliberately selects testcases to discover transient execution vulnerabilities effectively. When applied on RISC-V Boom v3, BPUFuzzer uncovered more Spectre types than the state-of-the-arts, including a previously unidentified variant, named Spectre-LOOP.
UR - https://www.scopus.com/pages/publications/105017791688
U2 - 10.1109/DAC63849.2025.11133085
DO - 10.1109/DAC63849.2025.11133085
M3 - 会议稿件
AN - SCOPUS:105017791688
T3 - Proceedings - Design Automation Conference
BT - 2025 62nd ACM/IEEE Design Automation Conference, DAC 2025
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 22 June 2025 through 25 June 2025
ER -