TY - GEN
T1 - Bidimensional empirical mode decomposition and non-uniform sampling based ultrasonic images compression
AU - Liu, Yipeng
AU - Jin, Jing
AU - Wang, Qiang
AU - Yi, Shen
PY - 2011
Y1 - 2011
N2 - In this paper, we propose an improved algorithm based on bidimensional empirical mode decomposition (BEMD) to compress the ultrasonic images. The algorithm uses morphological operators to identify the extrema of the image in the process of compression based on BEMD, and introduces variable sampling by different rates horizontally and vertically for overlapping blocks in the ultrasonic image. Furthermore, we propose the non-uniform sampling method for each single block considering the focalization of the extrema distribution. Finally, the performance of the proposed compression algorithm, using BEMD and non-uniform sampling, is demonstrated through the experiment conducted on an ultrasonic image.
AB - In this paper, we propose an improved algorithm based on bidimensional empirical mode decomposition (BEMD) to compress the ultrasonic images. The algorithm uses morphological operators to identify the extrema of the image in the process of compression based on BEMD, and introduces variable sampling by different rates horizontally and vertically for overlapping blocks in the ultrasonic image. Furthermore, we propose the non-uniform sampling method for each single block considering the focalization of the extrema distribution. Finally, the performance of the proposed compression algorithm, using BEMD and non-uniform sampling, is demonstrated through the experiment conducted on an ultrasonic image.
KW - bidimensional empirical mode decomposition
KW - morphological operators
KW - non-uniform sampling
KW - ultrasonic image compression
UR - https://www.scopus.com/pages/publications/80051905215
U2 - 10.1109/IMTC.2011.5944100
DO - 10.1109/IMTC.2011.5944100
M3 - 会议稿件
AN - SCOPUS:80051905215
SN - 9781424479351
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
SP - 436
EP - 440
BT - 2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011 - Proceedings
T2 - 2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011
Y2 - 10 May 2011 through 12 May 2011
ER -