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Bi-dierectional PCA with assembled matrix distance metric

  • School of Computer Science and Technology, Harbin Institute of Technology
  • Hong Kong Polytechnic University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Principal Component Analysis (PCA) has been very successful in image recognition. Recent researches on PCAbased methods are mainly concentrated on two issues, feature extraction and classification. In this paper we propose BiDirectional PCA (BDPCA) with assembled matrix distance (AMD) metric to simultaneously deal with these two issues. For feature extraction, we propose a BDPCA approach which can reduce the dimension of the original image matrix in both column and row directions. For classification, we present an AMD metric to calculate the distance between two feature matrices. The results of our experiments show that, BDPCA with AMD metric is very effective in image recognition.

Original languageEnglish
Title of host publicationIEEE International Conference on Image Processing 2005, ICIP 2005
Pages958-961
Number of pages4
DOIs
StatePublished - 2005
Externally publishedYes
EventIEEE International Conference on Image Processing 2005, ICIP 2005 - Genova, Italy
Duration: 11 Sep 200514 Sep 2005

Publication series

NameProceedings - International Conference on Image Processing, ICIP
Volume2
ISSN (Print)1522-4880

Conference

ConferenceIEEE International Conference on Image Processing 2005, ICIP 2005
Country/TerritoryItaly
CityGenova
Period11/09/0514/09/05

Keywords

  • 2DPCA
  • Face recognition
  • Image recognition
  • PCA
  • Palmprint recognition

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