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Beat frequency nonlinearity compensation based on fiber reference channel in laser frequency scanning interferometer

  • School of Electrical Engineering and Automation, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

High resolution and simple device ranging technology has prospects of broad application and attractive. Laser frequency scanning interferometer has capability of high-resolution, low-noise ratio measurement. The tuning nonlinearity is a main factor limited to the ranging resolution which needs to be corrected. When using hardware to correct laser tuning nonlinearity, it would increases the complexity of the instrument structure. For the purpose of making structure of the instrument much simple, we proposed a method that using fiber reference channel to compensate the nonlinearity of measurement path beat frequency, which can achieve high resolution measurement. The method require obtaining the reference and measurement path beat signal simultaneously, then extracting the phase of the reference channel signal which is formed by fiber end face to compensate the nonlinearity of measurement signal. Hilbert transform is used to calculate the phase of signal, and empirical mode decomposition (EMD) method is used to reduce the noise of reference signal. The laser frequency scanning interferometer is demonstrated by experiment, we show that this performance enables 132μm for 10nm tuning bandwidth over several meter range. The method does not need to estimate the tuning nonlinearity function, so it could reduce the complexity of algorithm.

Original languageEnglish
Title of host publicationAOPC 2015
Subtitle of host publicationOptical Test, Measurement, and Equipment
EditorsJonathan D. Ellis, Yongcai Guo, Sen Han, Junpeng Guo
PublisherSPIE
ISBN (Electronic)9781628419023
DOIs
StatePublished - 2015
Externally publishedYes
EventApplied Optics and Photonics, China: Optical Test, Measurement, and Equipment, AOPC 2015 - Beijing, China
Duration: 5 May 20157 May 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9677
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceApplied Optics and Photonics, China: Optical Test, Measurement, and Equipment, AOPC 2015
Country/TerritoryChina
CityBeijing
Period5/05/157/05/15

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