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Bad pixel replacement based on spatial statistics for IR sensor

  • Xiang Long Meng*
  • , Wei Zhang
  • , Ming Yu Cong
  • , Yi Ming Cao
  • , Wen Zhuo Bao
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

IR focal plane arrays typically contain bad pixels. Bad pixels have to be corrected because those can significantly impair the performance of target-detection algorithms. On the other hand, particularly as an aid to visual interpretation, it is desirable to replace the bad pixels. IR image contains spatial information and is correlative in spatial domain. In spatial statistics the semivariogram is an important function that relates semivariance to sampling lag. This function can characterize the spatial dependence of each point on its neighbor and provide a concise and unbiased description of the scale and pattern of spatial variability. One of the main reasons for deriving semivariogram is to use it in the process of estimation. Kriging is an interpolation and estimation technique that considers both the distance and the degree of variation between known data points when estimating values in unknown areas. In this paper a new technique based on spatial statistics is developed for bad pixel replacement. The main objective of the technique is to replace bad pixels through Kriging estimation. Theory analysis and experiments show that the method is reasonable and efficient.

Original languageEnglish
Title of host publication5th International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subtitle of host publicationOptoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
DOIs
StatePublished - 2010
Event5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Dalian, China
Duration: 26 Apr 201029 Apr 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7658
ISSN (Print)0277-786X

Conference

Conference5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Country/TerritoryChina
CityDalian
Period26/04/1029/04/10

Keywords

  • Bad pixel replacement
  • Kriging
  • Semivariogram
  • Spatial statistics

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