TY - GEN
T1 - Automatic wire bonder designed for MEMS packaging
AU - Liu, Yanjie
AU - Liu, Yuetao
AU - Sun, Lining
PY - 2008
Y1 - 2008
N2 - This paper introduces zoom microscope into the microscope positioning system to settle the contradiction between microscope's visual range and depth of field. In the whole bonding application, bond targets' identification and orientation are the most important aspects for full-automation. Multiple scale images go through various image processing programs, and finally different bond targets are identified and positioned. This measure is called "global-coarse and local-precise orientation", with which full-automation bonding is realized. A zoom microscope based micro-positioning system was used to capture the multiple magnification images. The requirement for real-time auto-focusing for zoom microscope is proposed based on the analysis of zoom microscope model.
AB - This paper introduces zoom microscope into the microscope positioning system to settle the contradiction between microscope's visual range and depth of field. In the whole bonding application, bond targets' identification and orientation are the most important aspects for full-automation. Multiple scale images go through various image processing programs, and finally different bond targets are identified and positioned. This measure is called "global-coarse and local-precise orientation", with which full-automation bonding is realized. A zoom microscope based micro-positioning system was used to capture the multiple magnification images. The requirement for real-time auto-focusing for zoom microscope is proposed based on the analysis of zoom microscope model.
UR - https://www.scopus.com/pages/publications/62249095327
U2 - 10.1109/DTIP.2008.4752944
DO - 10.1109/DTIP.2008.4752944
M3 - 会议稿件
AN - SCOPUS:62249095327
SN - 9782355000065
T3 - DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
SP - 21
EP - 23
BT - DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
T2 - DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
Y2 - 9 April 2008 through 11 April 2008
ER -