TY - GEN
T1 - Automatic registration based on improved SIFT for medical microscopic sequence images
AU - Tang, Chunming
AU - Dong, Yan
AU - Su, Xiaohong
PY - 2008
Y1 - 2008
N2 - Automatic registration in microscopic image sequence is a classical problem, which has not been solved well so far. According to the features of medical microscopic image sequence, the SIFT feature detection method of microscopic image registration is introduced. As large dimension of the traditional SIFT descriptor and its complex algorithm, an improved algorithm of the SIFT is presented, which can reduce the dimension. And a two-way matching algorithm is adopted to eliminate repeated matching points. Random Sampling Consensus algorithm (RANSAC) is applied for removal the wrong matching points to improve the accuracy of matching further. Compared with traditional registration algorithm, the results show that the improved SIFT algorithm has increased both in time-saving and complexity-reducing.
AB - Automatic registration in microscopic image sequence is a classical problem, which has not been solved well so far. According to the features of medical microscopic image sequence, the SIFT feature detection method of microscopic image registration is introduced. As large dimension of the traditional SIFT descriptor and its complex algorithm, an improved algorithm of the SIFT is presented, which can reduce the dimension. And a two-way matching algorithm is adopted to eliminate repeated matching points. Random Sampling Consensus algorithm (RANSAC) is applied for removal the wrong matching points to improve the accuracy of matching further. Compared with traditional registration algorithm, the results show that the improved SIFT algorithm has increased both in time-saving and complexity-reducing.
UR - https://www.scopus.com/pages/publications/62949247497
U2 - 10.1109/IITA.2008.586
DO - 10.1109/IITA.2008.586
M3 - 会议稿件
AN - SCOPUS:62949247497
SN - 9780769534978
T3 - Proceedings - 2008 2nd International Symposium on Intelligent Information Technology Application, IITA 2008
SP - 580
EP - 583
BT - Proceedings - 2008 2nd International Symposium on Intelligent Information Technology Application, IITA 2008
T2 - 2008 2nd International Symposium on Intelligent Information Technology Application, IITA 2008
Y2 - 21 December 2008 through 22 December 2008
ER -