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Automatic hammering of nano-patterns on special polymer film by using a vibrating AFM tip

  • Xiaodong Hong*
  • , Yongkang Yang
  • , You Wang
  • *Corresponding author for this work
  • Liaoning Technical University
  • Harbin Institute of Technology
  • Ministry of Education of the People's Republic of China

Research output: Contribution to journalArticlepeer-review

Abstract

Complicated nano-patterns with linewidth less than 18 nm can be automatically hammered by using atomic force microscopy (AFM) tip in tapping mode with high speed. In this study, the special sample was thin poly(styrene-ethylene/butylenes-styrene) (SEBS) block copolymer film with hexagonal spherical microstructures. An ordinary silicon tip was used as a nanohammer, and the entire hammering process is controlled by a computer program. Experimental results demonstrate that such structure-tailored thin films enable AFM tip hammering to be performed on their surfaces. Both imprinted and embossed nano-patterns can be generated by using a vibrating tip with a larger tapping load and by using a predefined program to control the route of tip movement as it passes over the sample's surface. Specific details for the fabrication of structure-tailored SEBS film and the theory for auto-hammering patterns were presented in detail.

Original languageEnglish
Article number456
JournalNanoscale Research Letters
Volume7
DOIs
StatePublished - 2012

Keywords

  • Atomic force microscopy
  • Automatic nanolithography
  • Poly(styrene-ethylene/butylenesstyrene)

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