Abstract
Aiming at the limitation of most TFT-LCD (Thin Film Transistor-Liquid Crystal Display) defect detection methods for micro defects, we propose an image registration method based on local template matching for implementing image registration in subpixel level. Then we propose a TFT-LCD micro defect detection algorithm based on the image substraction method and the subpixel image registration. With this method, we can detect TFT-LCD micro defects automatically. Application of this method to TFT-LCD array area detection and peripheral area detection shows that the rates of both miss and false detection are lower than 3% in array area, and are lower than 5% in peripheral area. Which can meet the detection requirement.
| Original language | English |
|---|---|
| Pages (from-to) | 1756-1760 |
| Number of pages | 5 |
| Journal | Harbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology |
| Volume | 40 |
| Issue number | 11 |
| State | Published - Nov 2008 |
| Externally published | Yes |
Keywords
- Defect detection
- Image registration
- Subpixel shift
- Substraction
- TFT-LCD
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