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Automatic detection algorithm for TFT-LCD micro display defects

  • Xiao Hong Su*
  • , Zhi Guang He
  • , Pei Jun Ma
  • *Corresponding author for this work
  • School of Computer Science and Technology, Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Aiming at the limitation of most TFT-LCD (Thin Film Transistor-Liquid Crystal Display) defect detection methods for micro defects, we propose an image registration method based on local template matching for implementing image registration in subpixel level. Then we propose a TFT-LCD micro defect detection algorithm based on the image substraction method and the subpixel image registration. With this method, we can detect TFT-LCD micro defects automatically. Application of this method to TFT-LCD array area detection and peripheral area detection shows that the rates of both miss and false detection are lower than 3% in array area, and are lower than 5% in peripheral area. Which can meet the detection requirement.

Original languageEnglish
Pages (from-to)1756-1760
Number of pages5
JournalHarbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology
Volume40
Issue number11
StatePublished - Nov 2008
Externally publishedYes

Keywords

  • Defect detection
  • Image registration
  • Subpixel shift
  • Substraction
  • TFT-LCD

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