TY - GEN
T1 - Attention structured Pattern Deep Learning for region induction thermography NDT
AU - Hu, Jue
AU - Gao, Bin
AU - Tian, Guiyun
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/6
Y1 - 2019/6
N2 - Induction Thermography is a crucial nondestructive testing technology which has a rapidly increasing range of applications for crack detection. A series of studies have been carried out in thermal sequences processing algorithms. However, these methods often suffer from the complex surface conditions of experiment components. In this study, we propose an end-to-end attention structured pattern deep learning method to achieve precise crack detection and localization. The proposed method integrates both time and spatial pattern mining for crack information with a deep region convolution neural network. Experiments on welding line cracks have shown attractive performance and verified the efficacy of the proposed structure.
AB - Induction Thermography is a crucial nondestructive testing technology which has a rapidly increasing range of applications for crack detection. A series of studies have been carried out in thermal sequences processing algorithms. However, these methods often suffer from the complex surface conditions of experiment components. In this study, we propose an end-to-end attention structured pattern deep learning method to achieve precise crack detection and localization. The proposed method integrates both time and spatial pattern mining for crack information with a deep region convolution neural network. Experiments on welding line cracks have shown attractive performance and verified the efficacy of the proposed structure.
KW - attention model
KW - induction thermography
KW - non-destructive testing
KW - pattern deep region learning
UR - https://www.scopus.com/pages/publications/85079058887
U2 - 10.1109/FENDT47723.2019.8962614
DO - 10.1109/FENDT47723.2019.8962614
M3 - 会议稿件
AN - SCOPUS:85079058887
T3 - Proceedings of 2019 IEEE Far East NDT New Technology and Application Forum, FENDT 2019
SP - 81
EP - 84
BT - Proceedings of 2019 IEEE Far East NDT New Technology and Application Forum, FENDT 2019
A2 - Xu, Chunguang
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE Far East NDT New Technology and Application Forum, FENDT 2019
Y2 - 24 June 2019 through 27 June 2019
ER -